High and low temperature test chamber
High, low temperature, and low pressure test chamber
Mainly used in the fields of aviation, aerospace, information, electronics, etc., to determine the environmental adaptability and reliability tests of instruments, electrical products, materials, components and equipment under low pressure, high temperature, low temperature or simultaneous effects, and to measure the electrical performance parameters of the test piece when it is energized.
CONTENT
GJB150.3-1986 High temperature test;
GJB150.4-1986 Low temperature test;
GJB150.6-1986 Temperature altitude test;
GB/T2423.1-2008 Experiment A: Low temperature test method;
GB/T2423.2-2008 Experiment B: High temperature test method;
GJB360A-1996 Method 105: Low pressure test;
GB/T2423.21-2008 Test M: Low pressure test method;
GB/T2423.25-2008 Test Z/AM: Low temperature/low pressure comprehensive test;
GB/T2423.26-1992 Test Z/BM: High temperature/low pressure comprehensive test.
